Remeasurement of the CuKα1 Emission X-Ray Wavelength in the Metrical System (Present Stage)
- 16 May 1991
- journal article
- research article
- Published by Wiley in Physica Status Solidi (a)
- Vol. 125 (1) , 79-89
- https://doi.org/10.1002/pssa.2211250105
Abstract
No abstract availableKeywords
This publication has 20 references indexed in Scilit:
- Silicon lattice parameters as an absolute scale of length for high precision measurements of fundamental constantsPhysica Status Solidi (a), 1990
- Measurement of X-ray diffraction angles of perfect monocrystals with high accuracy using a single crystal diffractometerPhysica Status Solidi (a), 1989
- Study of the Kα emission spectrum of copperX-Ray Spectrometry, 1986
- Peak Position Determination of X‐Ray Diffraction Profiles in Precision Lattice Parameter Measurements According to the Bond‐Method with Help of the Polynomial ApproximationCrystal Research and Technology, 1986
- The lattice parameter of highly pure silicon single crystalsZeitschrift für Physik B Condensed Matter, 1982
- Absolute Measurement of the (220) Lattice Plane Spacing in a Silicon CrystalPhysical Review Letters, 1981
- Principles and design of Laue-case X-Ray interferometersThe European Physical Journal A, 1965
- Precision lattice constant determinationActa Crystallographica, 1960
- Absolute Wave-Lengths of the Copper and Chromium-SeriesPhysical Review B, 1931
- The reflection of X-rays by crystalsProceedings of the Royal Society of London. Series A, Containing Papers of a Mathematical and Physical Character, 1913