Comparison of Bayesian and frequentist assessments of uncertainty for selecting the best system
- 27 November 2002
- proceedings article
- Published by Institute of Electrical and Electronics Engineers (IEEE)
- Vol. 1, 727-734
- https://doi.org/10.1109/wsc.1998.745057
Abstract
No abstract availableThis publication has 7 references indexed in Scilit:
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