Auger, ellipsometry, and environmental studies of thin films applied to schottky (MIS) solar cells
- 1 May 1978
- journal article
- Published by Springer Nature in Journal of Electronic Materials
- Vol. 7 (3) , 403-414
- https://doi.org/10.1007/bf02655645
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- Factors which maximize the efficiency of Cr–p-Si Schottky (MIS) solar cellsJournal of Vacuum Science and Technology, 1976
- Oscillations in MOS tunnelingJournal of Applied Physics, 1975
- An 8% efficient layered Schottky-barrier solar cellJournal of Applied Physics, 1974
- Minority carrier MIS tunnel diodes and their application to electron- and photo-voltaic energy conversion—I. TheorySolid-State Electronics, 1974