High-performance and high-yield Ka-band low-noise MMIC using 0.25- mu m ion-implanted MESFET's

Abstract
The performance of LNA (low-noise amplifier) MMICs (monolithic microwave integrated circuits) in Ka-band using only ion-implantation technology is presented. Three-stage LNAs fabricated using a high-yield 0.25- mu m ion-implanted process showed a 4.2 dB average noise figure with a 15-dB gain in Ka-band. It is concluded that this relatively inexpensive technology, if maximized for the performance, shows good promise in applications where unit cost is critical and volume is high.

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