Variation of trapping/detrapping properties as a function of the insulator size
- 1 August 1993
- journal article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 74 (3) , 1960-1967
- https://doi.org/10.1063/1.354780
Abstract
Using the scanning electron microscope we have investigated the physical parameters determining the size effect of various dielectric samples submitted to a surface electric field. It is shown that the size effect is a function of the static permittivity and of the space charge distribution. The results are explained by the consideration of charge diffusion and polarization relaxation processes resulting from the space charge formation. A one-dimensional mathematical model has also been used to describe space charge distribution. The findings were consistent with the experimental observations.This publication has 9 references indexed in Scilit:
- Insulator surface analysisJournal of Electron Spectroscopy and Related Phenomena, 1992
- Breakdown phenomena related to trapping/detrapping processes in wide band gap insulatorsIEEE Transactions on Electrical Insulation, 1992
- Flashover in wide-band-gap high-purity insulators: Methodology and mechanismsJournal of Applied Physics, 1991
- Electrets: Dielectrics with Quasi-Permanent Charge or PolarizationIEEE Transactions on Electrical Insulation, 1987
- Space-charge conduction and relaxation in dielectric filmsJournal of Applied Physics, 1987
- Superconducting Sn/Sn-oxide/Sn tunneling junctions as high-resolution x-ray detectorsJournal of Applied Physics, 1987
- Surface flashover of solid insulators in atmospheric air and in vacuumJournal of Applied Physics, 1985
- Electric Surface Strength and Surface Deterioration of Thermoplastic Insulators in VacuumIEEE Transactions on Electrical Insulation, 1983
- Pulsed Flashover of Insulators in VacuumIEEE Transactions on Electrical Insulation, 1972