Analysis of resistivity, hall effect, and magnetoresistance measurements of thin bismuth films by means of an anisotropic two-carrier model
- 16 January 1983
- journal article
- research article
- Published by Wiley in Physica Status Solidi (a)
- Vol. 75 (1) , 227-233
- https://doi.org/10.1002/pssa.2210750125
Abstract
No abstract availableKeywords
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