Review of built-in test methodologies for gate arrays
- 1 January 1985
- journal article
- review article
- Published by Institution of Engineering and Technology (IET) in IEE Proceedings I Solid State and Electron Devices
- Vol. 132 (2) , 121
- https://doi.org/10.1049/ip-i-1.1985.0025
Abstract
No abstract availableThis publication has 1 reference indexed in Scilit:
- Diagnosis & Reliable Design of Digital SystemsPublished by Springer Nature ,1976