Problems associated with the measurement of X-ray attenuation coefficients. I. Silicon. Report of the International Union of Crystallography X-ray Attenuation Project
- 1 January 1987
- journal article
- Published by International Union of Crystallography (IUCr) in Acta Crystallographica Section A Foundations of Crystallography
- Vol. 43 (1) , 102-112
- https://doi.org/10.1107/s0108767387099793
Abstract
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