Anwendung der „Optimalfilter‐Methode”︁ bei der röntgendiffraktometrischen Bestimmung von Differenz‐Elektronendichten
- 1 January 1975
- journal article
- research article
- Published by Wiley in Crystal Research and Technology
- Vol. 10 (8) , 821-828
- https://doi.org/10.1002/crat.19750100805
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- MetallphysikPublished by Springer Nature ,1974
- X-ray scattering factors computed from numerical Hartree–Fock wave functionsActa Crystallographica Section A, 1968
- The covalent bond in siliconProceedings of the Royal Society of London. Series A. Mathematical and Physical Sciences, 1967