An electron spectrometer for LEED fine structure measurements

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1 August 1985

journal article
Published by Elsevier in Applied Surface Science

Vol. 24 (2) , 202-212
https://doi.org/10.1016/0169-4332(85)90225-9

Abstract

No abstract available

Keywords

This publication has 8 references indexed in Scilit:

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Electronic surface resonances of crystals
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$L_{2, 3} VV$ and $MVV$ Auger spectra of copper
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On the possible application of LEED to the study of surface potential barriers
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