Changes in thick-film resistor values due to substrate flexure

• 1 October 1973
• journal article
• Published by Elsevier in Microelectronics Reliability
• Vol. 12  (4) , 395-396
• https://doi.org/10.1016/0026-2714(73)90335-1

Abstract

Keywords

• THICK FILM
• FILM RESISTOR
• SUBSTRATE FLEXURE
• RESISTOR VALUES
• VALUES DUE
• CHANGES IN THICK