A low-temperature gas-flow total electron yield detector for XAFS measurements
Open Access
- 1 September 1992
- journal article
- Published by Elsevier in Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
- Vol. 71 (3) , 345-350
- https://doi.org/10.1016/0168-583x(92)95407-i
Abstract
No abstract availableKeywords
This publication has 13 references indexed in Scilit:
- A gas-flow electron yield detector for glancing-incidence EXAFSNuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 1990
- X-ray-absorption studies of Y-Ba-Cu-O and Bi-Sr-Ca-Cu-O films at oxygenKedge by means of fluorescence and total electron yield: A comparison of two techniquesPhysical Review B, 1990
- Comparative study of fluorescence- and electron-yield detection on at the O K edge through x-ray absorptionPhysical Review B, 1990
- Application of various XAFS techniques to the investigation of structurally damaged materialsPhysica B: Condensed Matter, 1989
- Structure determination of metastable cobalt filmsPhysical Review Letters, 1989
- Total-electron-yield current measurements for near-surface extended x-ray-absorption fine structurePhysical Review B, 1988
- Conversion-electron extended x-ray-absorption fine-structure measurements of ion-damaged GaAsPhysical Review B, 1987
- Extended x-ray-absorption fine structure: Direct comparison of absorption and electron yieldPhysical Review B, 1985
- Bonding of Oxygen on Al(111): A Surface Extended X-Ray Absorption Fine-Structure StudyPhysical Review Letters, 1979
- Extended X-Ray-Absorption Fine Structure of Surface Atoms on Single-Crystal Substrates: Iodine Adsorbed on Ag(111)Physical Review Letters, 1978