Test coverage dependent software reliability estimation by the HGD model
- 2 January 2003
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
Abstract
No abstract availableThis publication has 6 references indexed in Scilit:
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- The hyper-geometric distribution software reliability growth model (HGDM): precise formulation and applicabilityPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2002
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