About the use of electron energy-loss spectroscopy for chemical mapping of thin foils with high spatial resolution

This publication has 5 references indexed in Scilit:

• Report of a workshop on analytical electron microscopy held at Cornell University, Ithaca, New York, USA, August 3–6, 1976
  Ultramicroscopy, 1977
• Contribution of electron energy loss spectroscopy to the development of analytical electron microscopy
  Ultramicroscopy, 1976
• Use of coincidence techniques to improve the detection limits of electron spectroscopy in stem
  Ultramicroscopy, 1976
• The microanalysis of light elements using transmitted energy loss electrons
  Ultramicroscopy, 1975
• Inelastic scattering of 80 keV electrons in amorphous carbon
  Philosophical Magazine, 1975