Experimental Evidence of Surface-Plasmon Coupling in Anisotropic Hollow Nanoparticles
- 26 July 2001
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review Letters
- Vol. 87 (7) , 075501
- https://doi.org/10.1103/physrevlett.87.075501
Abstract
We report on the investigation of surface-plasmon excitation of anisotropic hollow nanoparticles in a near-field geometry by means of a scanning transmission electron microscope. The shell thickness influence on the electron-energy-loss-spectroscopy spectra is experimentally observed and is analyzed within a classical dielectric formalism. As for the isotropic case, we evidence one symmetric (tangential) and one antisymmetric (radial) mode. We point out the intriguing fact that, for the anisotropic case, one can relate these modes to the interband transition of the in-plane component of the dielectric tensor and to the bulk-plasmon energy of the out-of-plane component.
Keywords
This publication has 24 references indexed in Scilit:
- Photon Emission Spectroscopy of Individual Oxide-Supported Silver Clusters in a Scanning Tunneling MicroscopePhysical Review Letters, 2000
- Plasmon excitations in graphitic carbon spheres measured by EELSPhysical Review B, 2000
- Squeezing the Optical Near-Field Zone by Plasmon Coupling of Metallic NanoparticlesPhysical Review Letters, 1999
- Surface-Plasmon Resonances in Single Metallic NanoparticlesPhysical Review Letters, 1998
- Extraordinary optical transmission through sub-wavelength hole arraysNature, 1998
- Computation of the ultraviolet absorption and electron inelastic scattering cross section of multishell fullerenesPhysical Review B, 1994
- Réponse diélectrique de surface des phonons optiques d'un film de cristal ioniqueJournal de Physique I, 1993
- Polarization waves and van der Waals cohesion offulleritePhysical Review B, 1992
- Theoretical and experimental study of plasmon excitations in small metallic spheresUltramicroscopy, 1986
- Measurement of surface-plasmon dispersion in oxidized aluminum filmsPhysical Review B, 1975