Dependence of ESR Line Width on Donor Concentration in Silicon
- 1 November 1965
- journal article
- Published by Physical Society of Japan in Journal of the Physics Society Japan
- Vol. 20 (11) , 2098
- https://doi.org/10.1143/jpsj.20.2098
Abstract
No abstract availableThis publication has 2 references indexed in Scilit:
- ESR of Study of Interaction among Impurity Atoms in SiliconJournal of the Physics Society Japan, 1965
- Exchange Narrowing in Paramagnetic ResonanceReviews of Modern Physics, 1953