Gain uniformity, linearity, saturation, and depletion in gated microchannel-plate x-ray framing cameras

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Abstract
The pulsed characteristics of gated, microstrip configuration microchannel-plate (MCP) detectors used in x-ray framing cameras deployed on laser plasma experiments worldwide are examined in greater detail. The detectors are calibrated using short (20 ps) and long (500 ps) pulse x-ray irradiation and 3 - 60 ps, deep UV (202 and 213 nm), spatially-smoothed laser irradiation. Two-dimensional unsaturated gain profiles show < 5% long-range transverse variations but up to 3 dB/cm drop in gain parallel to the pulse propagation direction. Up to 50% gain enhancements due to voltage reflection from the bends of a meander stripline geometry and from the ends of conventional straight striplines are also observed. Reproducible gate profiles are obtained with either picosecond x-ray or UV bursts and FWHM extracted with 3 picosecond accuracy. A novel single-shot method for measuring local gate propagation speeds using a tilted MCP is also demonstrated.

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