Avalanche-Induced Current Enhancement in Semiconducting Carbon Nanotubes
- 16 December 2008
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review Letters
- Vol. 101 (25) , 256804
- https://doi.org/10.1103/physrevlett.101.256804
Abstract
Semiconducting single-wall carbon nanotubes under high electric field stress () display a remarkable current increase due to avalanche generation of free electrons and holes. Unlike other materials, the avalanche process in such 1D quantum wires involves access to the third subband and is insensitive to temperature but strongly dependent on diameter . Comparison with a theoretical model yields a novel approach to obtain the inelastic optical phonon emission length . The new results underscore the importance of multiband transport in 1D molecular wires.
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This publication has 23 references indexed in Scilit:
- Electrical and thermal transport in metallic single-wall carbon nanotubes on insulating substratesJournal of Applied Physics, 2007
- On the current delivery limit of semiconducting carbon nanotubesJournal of Computer-Aided Materials Design, 2007
- Electric-Field-Dependent Charge-Carrier Velocity in Semiconducting Carbon NanotubesPhysical Review Letters, 2005
- Band Structure, Phonon Scattering, and the Performance Limit of Single-Walled Carbon Nanotube TransistorsPhysical Review Letters, 2005
- High-Field Quasiballistic Transport in Short Carbon NanotubesPhysical Review Letters, 2004
- High-Field Electrical Transport in Single-Wall Carbon NanotubesPhysical Review Letters, 2000
- “Universal” Dependence of Avalanche Breakdown on Bandstructure: Choosing Materials for High-Power DevicesJapanese Journal of Applied Physics, 1997
- VIA-4 avalanche-induced breakdown mechanisms in short-channel MOSFETsIEEE Transactions on Electron Devices, 1982
- Threshold Energies for Electron-Hole Pair Production by Impact Ionization in SemiconductorsPhysical Review B, 1972
- TEMPERATURE DEPENDENCE OF AVALANCHE MULTIPLICATION IN SEMICONDUCTORSApplied Physics Letters, 1966