A Simple Method For The Determination of Thickness and Grain Size of Deposited Films as Used On Non-Conductive Specimens For Scanning Electron Microscopy
- 1 April 1978
- journal article
- Published by Wiley in Journal of Microscopy
- Vol. 112 (3) , 359-364
- https://doi.org/10.1111/j.1365-2818.1978.tb00087.x
Abstract
No abstract availableKeywords
This publication has 2 references indexed in Scilit:
- Preparation of Samples for Scanning Electron MicroscopyProceedings, annual meeting, Electron Microscopy Society of America, 1970
- The Apparent Size of Objects as Observed in the Electron MicroscopeJournal of Applied Physics, 1950