Concurrent and distributed desk checking

This publication has 4 references indexed in Scilit:

• Concurrent bug patterns and how to test them
  Published by Institute of Electrical and Electronics Engineers (IEEE) ,2004
• Cross-product functional coverage measurement with temporal properties-based assertions [logic verification]
  Published by Institute of Electrical and Electronics Engineers (IEEE) ,2003
• Design and implementation of a fine-grained software inspection tool
  IEEE Transactions on Software Engineering, 2003
• Low-contact learning in a first year programming course
  Published by Association for Computing Machinery (ACM) ,1996