Automated qualitative wavelength‐dispersive x‐ray fluorescence analysis
- 11 April 1982
- journal article
- Published by Wiley in X-Ray Spectrometry
- Vol. 11 (2) , 83-88
- https://doi.org/10.1002/xrs.1300110211
Abstract
A SRSO1 Siemens x‐ray spectrometer equipped with a logical controller was controlled by a Tektronix 4051 computer to record step by step the x‐ray fluorescence intensities. Ten samples can be analysed after the recording of 2 spectra (LiF (110) and PET) for each sample on a magnetic tape. On a host computer, a program first reduces the x‐ray fluorescence spectra to find the peak parameters for each line and another program subsequently identifies the elements.Keywords
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