Automated qualitative wavelength‐dispersive x‐ray fluorescence analysis

Abstract
A SRSO1 Siemens x‐ray spectrometer equipped with a logical controller was controlled by a Tektronix 4051 computer to record step by step the x‐ray fluorescence intensities. Ten samples can be analysed after the recording of 2 spectra (LiF (110) and PET) for each sample on a magnetic tape. On a host computer, a program first reduces the x‐ray fluorescence spectra to find the peak parameters for each line and another program subsequently identifies the elements.