Experimental Verification of Low-Loss TM Modes in Dielectric-Lined Waveguide

• 1 April 1973
• journal article
• website
• Published by Institute of Electrical and Electronics Engineers (IEEE) in Bell System Technical Journal
• Vol. 52  (4) , 487-496
• https://doi.org/10.1002/j.1538-7305.1973.tb01974.x

Abstract

Keywords

• EXPERIMENTAL VERIFICATION
• LINED WAVEGUIDE
• LOSS TM
• DIELECTRIC
• VERIFICATION OF LOW