Rapid Measurement of Dielectric Substrate Permittivity at X Band
- 1 March 1975
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Instrumentation and Measurement
- Vol. 24 (1) , 82-83
- https://doi.org/10.1109/tim.1975.4314375
Abstract
A technique for rapid measurements at 8-12 GHz of dielectric substrate permittivities in the range ϵ ~9-100 is described using a novel resonant cavity configuration for inserting and removing substrate samples.Keywords
This publication has 2 references indexed in Scilit:
- A Quick Accurate Method to Measure the Dielectric Constant of Microwave Integrated-Circuit Substrates (Short Papers)IEEE Transactions on Microwave Theory and Techniques, 1973
- Microwave Measurement of High-Dielectric- Constant MaterialsIEEE Transactions on Microwave Theory and Techniques, 1966