Thin-Film Interferometric Techniques for High-Magnification Topographical Studies

• 1 July 1952
• journal article
• letter
• Published by Springer Nature in Nature
• Vol. 170  (4315) , 81-82
• https://doi.org/10.1038/170081b0

Abstract

Keywords

• THIN FILM
• HIGH RESOLUTION
• SURFACE TOPOGRAPHY