Magneto-Optic Kerr Effect in RF Sputtered Co–Cr Film with Perpendicular Anisotropy

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Abstract
The polar Kerr rotation and ellipticity, together with the reflectivity, have been measured at λ≃0.4–0.8 µm, for a Co–Cr film (Cr≃21.5 atomic %) with perpendicular magnetic anisotropy. The film was RF sputter-deposited on an anodized aluminum substrate of a rigid disc. The values of the Kerr double rotation at saturation and remnant magnetization fall in the ranges of 7–9 minutes and 1.2–1.5 minutes, respectively, and that of the double ellipticity at saturation in 1.0–5.5 minutes. The reflectivity is 50–70%. The external-field dependence of the Kerr rotation exhibited a hysteresis with a small coercive force and remanence, in comparison with those obtained by magnetic measurement, indicating that the coercivity near the film surface is weaker than that inside.