Modeling charge collection and single event upsets in microelectronics

Publisher Website

1 July 1991

journal article
Published by Elsevier in Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

Vol. 61 (1) , 52-60
https://doi.org/10.1016/0168-583x(91)95560-z

Abstract

No abstract available

Keywords

This publication has 8 references indexed in Scilit:

Estimating the Dimensions of the SEU-Sensitive Volume
IEEE Transactions on Nuclear Science, 1987
Comparison of Soft Errors Induced by Heavy Ions and Protons
IEEE Transactions on Nuclear Science, 1986
The Variability of Single Event Upset Rates in the Natural Environment
IEEE Transactions on Nuclear Science, 1983
Alpha-particle-induced field and enhanced collection of carriers
IEEE Electron Device Letters, 1982
Proton-Induced Nuclear Reactions in Silicon
IEEE Transactions on Nuclear Science, 1981
Cosmic-Ray-Induced Errors in MOS Devices
IEEE Transactions on Nuclear Science, 1980
Upset Phenomena Induced by Energetic Protons and Electrons
IEEE Transactions on Nuclear Science, 1980
Satellite Anomalies from Galactic Cosmic Rays
IEEE Transactions on Nuclear Science, 1975