An electronic speckle pattern interferometer for complete in-plane displacement measurement
- 1 October 1990
- journal article
- Published by IOP Publishing in Measurement Science and Technology
- Vol. 1 (10) , 1024-1030
- https://doi.org/10.1088/0957-0233/1/10/006
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- 3D strain measurements using ESPIOptics and Lasers in Engineering, 1988
- The design and application of a speckle pattern interferometer for total plane strain field measurementOptics & Laser Technology, 1976
- Elastic constant and strain measurements using a three beam speckle pattern interferometerJournal of Physics E: Scientific Instruments, 1974
- Simple two-dimensional laser velocimeter opticsJournal of Physics E: Scientific Instruments, 1972