Sapphire Photocurrent Sources and Their Impact on RAM Upset
- 1 December 1986
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Nuclear Science
- Vol. 33 (6) , 1377-1380
- https://doi.org/10.1109/tns.1986.4334608
Abstract
No abstract availableThis publication has 2 references indexed in Scilit:
- Transient Imprint Memory Effect in MOS MemoriesIEEE Transactions on Nuclear Science, 1986
- Transient Photocurrents in SOS StructuresIEEE Transactions on Nuclear Science, 1973