Real-time displacement and tilt analysis by a speckle technique using Bi12SiO20-crystals
- 30 September 1980
- journal article
- Published by Elsevier in Optics Communications
- Vol. 34 (3) , 327-331
- https://doi.org/10.1016/0030-4018(80)90388-0
Abstract
No abstract availableKeywords
This publication has 7 references indexed in Scilit:
- Phase-conjugation and spatial-frequency dependence of wave-front reflectivity in Bi_12SiO_20 crystalsOptics Letters, 1980
- Light diffraction and nonlinear image processing in electrooptic Bi12SiO20 crystalsOptics Communications, 1979
- Some polarization properties of volume holograms in Bi_12SiO_20 crystals and applicationsApplied Optics, 1978
- Time average holographic interferometry with photoconductive electrooptic Bi_12SiO_20 crystalsApplied Optics, 1977
- Application of saturation spectroscopy to the measurement of C_2, ^3Π_u concentrations in oxy-acetylene flamesApplied Optics, 1977
- High-sensitivity read-write volume holographic storage in Bi12SiO20 and Bi12GeO20 crystalsApplied Physics Letters, 1976
- Coupled Wave Theory for Thick Hologram GratingsBell System Technical Journal, 1969