Measurements of Dielectric Constant of Rutile (TiO2) at Microwave Frequencies between 4.2° and 300°K
- 1 April 1962
- journal article
- research article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 33 (4) , 1450-1453
- https://doi.org/10.1063/1.1728753
Abstract
The microwave dielectric constant k′ and loss tangent (tanδ) of rutile have been measured as a function of temperature from 4.2° to 300°K. At low temperatures, k′ approaches the limiting value of 256 in the c direction and 131 in the a direction. The loss tangent at 4.2°K is 2.5×10−6 for pure rutile and increases by an order of magnitude for both 0.12% chromium and 0.2% iron‐doped rutile.This publication has 5 references indexed in Scilit:
- Measurement of Small Dielectric Losses in Material with a Large Dielectric Constant at Microwave FrequenciesIEEE Transactions on Microwave Theory and Techniques, 1961
- Dielectric Constant and Dielectric Loss of Ti(Rutile) at Low FrequenciesPhysical Review B, 1960
- Chromium-Doped Titania as a Maser MaterialJournal of Applied Physics, 1960
- Properties of Rutile (Titanium Dioxide)Reviews of Modern Physics, 1959
- Electrical and Optical Properties of Rutile Single CrystalsPhysical Review B, 1952