Fractal processes and Weibull statistics
- 13 January 2003
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
- p. 538-532
- https://doi.org/10.1109/icsd.1989.69269
Abstract
The use of Weibull statistics to study dielectric failure is discussed. Fractal processes involved in breakdown are considered, with particular emphasis on the stochastic progress of a filamentary discharge or conducting path. Here fluctuations in the length at a given time will lead to a Weibull statistic in time. Electrical trees are used to illustrate some of the points discussed Author(s) Dissdo, L./A/. Dept. of Phys., King's Coll. LondonKeywords
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