Characterization and quality control of silicon microstrip detectors with an infrared diode laser system
- 1 January 1995
- journal article
- Published by Elsevier in Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
- Vol. 352 (3) , 573-578
- https://doi.org/10.1016/0168-9002(95)90007-1
Abstract
No abstract availableKeywords
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