Apparatus for measurement of thermal E.M.F. in semi-conductors

• 1 April 1958
• journal article
• Published by IOP Publishing in Journal of Scientific Instruments
• Vol. 35  (4) , 146-147
• https://doi.org/10.1088/0950-7671/35/4/410

Abstract

Keywords

• SEMI CONDUCTORS
• THERMAL E.M.F
• APPARATUS FOR MEASUREMENT
• MEASUREMENT OF THERMAL