Holographic recording in photorefractive thin films: Edge effects
- 15 October 1995
- journal article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 78 (8) , 4840-4844
- https://doi.org/10.1063/1.359769
Abstract
The initial holographic recording rate has been analytically studied for a photorefractive thin slab. The finite thickness is explicitly taken into account by using a two-dimensional formulation (coordinates x and z parallel and perpendicular to the slab faces, respectively). It is shown that for a thickness comparable to the grating period, the solution appreciably departs from the usual one-dimensional result, i.e., edge effects are remarkable. In particular, significant space-charge fields perpendicular to the slab faces are generated. These effects may substantially modify the diffraction properties of the recorded photorefractive gratings, as exemplified for a GaAs film.This publication has 17 references indexed in Scilit:
- Fast Photorefractive effect in PVK:C60:DEANST Polymer CompositeThe Journal of Physical Chemistry, 1994
- Bandgap and Defect Engineering for Semiconductor Holographic Materials: Photorefractive Quantum Wells and Thin FilmsMRS Bulletin, 1994
- Observation of the photorefractive effect in a dialkylaminonitrostilbene copolymerOptics Letters, 1993
- Cr-doped GaAs/AlGaAs semi-insulating multiple quantum well photorefractive devicesApplied Physics Letters, 1993
- Photorefractive effect in a new organic system of doped nonlinear polymerApplied Physics Letters, 1992
- Photorefractive quantum wells: transverse Franz–Keldysh geometryJournal of the Optical Society of America B, 1992
- High-speed photodiffractive effect in semi-insulating CdZnTe/ZnTe multiple quantum wellsOptics Letters, 1992
- Observation of the photorefractive effect in a polymerPhysical Review Letters, 1991
- Resonant photodiffractive effect in semi-insulating multiple quantum wellsJournal of the Optical Society of America B, 1990
- Holographic storage in electrooptic crystals. i. steady stateFerroelectrics, 1978