Optimal method for the affine F-matrix and its uncertainty estimation in the sense of both noise and outliers
- 13 November 2002
- proceedings article
- Published by Institute of Electrical and Electronics Engineers (IEEE)
- Vol. 2, 166-173
- https://doi.org/10.1109/iccv.2001.937620
Abstract
No abstract availableThis publication has 16 references indexed in Scilit:
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