An automatic topographical surface reconstruction in the SEM
- 1 January 1979
- Vol. 2 (4) , 230-237
- https://doi.org/10.1002/sca.4950020405
Abstract
No abstract availableThis publication has 3 references indexed in Scilit:
- Measuring surface variations with the scanning electron microscope using deposited contamination linesJournal of Physics E: Scientific Instruments, 1971
- Secondary Electron EmissionPublished by Elsevier ,1958
- Die Abhängigkeit der Sekundärelektronenemission einiger Metalle vom Einfallswinkel des primären KathodenstrahlsThe European Physical Journal A, 1937