Vibrational characterization of aluminum–oxo phthalocyanine films. IR, Raman and surface‐enhanced Raman spectroscopic studies

Abstract
The vibrational characterization of bis(phthalocyanatoaluminum) oxide [(PcAl)2O] was attempted using infrared, Raman, SERS, RRS and SERRS spectra of thin solid films. Vibrational fundamentals observed for microcrystallites of (PcAl)2O dispersed in KBr, evaporated thin films and at submonolayer coverage of a SERS active surface were identified with characteristic vibrational frequencies of the phthalocyanine (Pc) moiety. Evidence for a certain degree of molecular organization in the evaporated thin solid films is presented, based on IR and Raman data.