Analyzing the Surface Temperature Depression in Hot Stage Atomic Force Microscopy with Unheated Cantilevers: Application to the Crystallization of Poly(ethylene oxide)
- 27 December 2001
- journal article
- research article
- Published by American Chemical Society (ACS) in Langmuir
- Vol. 18 (2) , 490-498
- https://doi.org/10.1021/la010977x
Abstract
No abstract availableKeywords
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