Studies Of The Si/SiO2 Interface Using Synchrotron Radiation

• 28 June 1985
• proceedings article
• Published by SPIE-Intl Soc Optical Eng
• Vol. 0524, 18
• https://doi.org/10.1117/12.946315

Abstract

Keywords

• INTERFACES
• SILICA
• SYNCHROTRON RADIATION
• PHOTONS
• OXIDES
• PHOTOEMISSION SPECTROSCOPY
• ABSORPTION
• ELECTRONS
• X-RAYS