Observation of small defects in silicon crystal by diffuse x-ray scattering

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Abstract
Two kinds of diffuse x‐ray scattering due to defects were observed from a very perfect silicon single crystal. One forms the shape of a cigar, elongated along the [111] direction, and the other is a disk, which is broad and perpendicular to the [111] direction. The cigar‐shaped diffuse scattering is asymmetric around the 111 relp with respect to the Bragg peak. Fourier transforms reveal two types of defects; platelike defects [200 Å (φ) ×30 Å (t)] of vacancy type and needlelike defects (400 A (l)). The platelike defect dimensions are in fairly good agreement with those of B‐swirl defects observed by de Kock et al. The platelike defects also have a close correlation with the crystal pulling direction. They are contained predominantly in the (111) planes for a crystal grown along the [111] direction.