High spatial resolution analysis using parallel detection EELS
- 1 January 1986
- journal article
- Published by Elsevier in Ultramicroscopy
- Vol. 20 (1-2) , 43-49
- https://doi.org/10.1016/0304-3991(86)90167-1
Abstract
No abstract availableKeywords
This publication has 12 references indexed in Scilit:
- Electron-energy-loss near-edge structure ofCPhysical Review B, 1986
- Inelastic scattering of fast electrons in clusters of small spheresSurface Science, 1985
- Quantitative data processing of parallel recorded electron energy-loss spectra with low signal to backgroundReview of Scientific Instruments, 1985
- Position stabilization of EELS spectraJournal of Electron Microscopy Technique, 1985
- Intelligent interface for a microprocessor controlled scanning transmission electron microscope with x‐ray imagingJournal of Electron Microscopy Technique, 1984
- On the measurement of surface step heights by low-loss imaging in stemUltramicroscopy, 1983
- ALCHEMI: a new technique for locating atoms in small crystalsJournal of Microscopy, 1983
- Study of theedges in thetransition metals and their oxides by electron-energy-loss spectroscopy with comparisons to theoryPhysical Review B, 1982
- Crystallographic orientation effects in energy dispersive X-ray analysisPhilosophical Magazine A, 1981
- Formulae for light-element micro analysis by electron energy-loss spectrometryUltramicroscopy, 1978