Existence of Double-Charged Oxide Traps in Submicron MOSFET's

• 20 November 1989
• journal article
• Published by IOP Publishing in Japanese Journal of Applied Physics
• Vol. 28  (Part 2, No) , 2057-2060
• https://doi.org/10.1143/jjap.28.2057

Abstract

Keywords

• ELECTROSTATIC POTENTIAL
• COULOMB POTENTIAL
• TWO DIMENSIONAL ELECTRON GAS