Stress analysis in ion-exchanged waveguides by using a polarimetric technique

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Abstract
Binary ion exchange is widely used to fabricate passive waveguide components for application in integrated optics. In this paper the authors present a technique for determining the stress in ion-exchanged waveguides; this is accomplished by measuring the phase difference between TM and TE modes of a certain order, excited at the same time in the waveguide by entering it with a light beam linearly polarized at an angle of 45 degree(s) with respect to the stress axes. The phase difference of the two modes due to the stress anisotropy is measured without requiring precise angular settings or absolute intensity measurements. The technique has been checked by analyzing some Ag+-Na+ exchanged waveguides, and particular attention has been paid to the analysis of waveguides prepared by electromigration processes.

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