A nondestructive method for determining the spring constant of cantilevers for scanning force microscopy
- 1 February 1993
- journal article
- conference paper
- Published by AIP Publishing in Review of Scientific Instruments
- Vol. 64 (2) , 403-405
- https://doi.org/10.1063/1.1144209
Abstract
The spring constant of microfabricated cantilevers used in scanning force microscopy (SFM) can be determined by measuring their resonant frequencies before and after adding small end masses. These masses adhere naturally and can be easily removed before using the cantilever for SFM, making the method nondestructive. The observed variability in spring constant—almost an order of magnitude for a single type of cantilever—necessitates calibration of individual cantilevers in work where precise knowledge of forces is required. Measurements also revealed that the spring constant scales with the cube of the unloaded resonant frequency, providing a simple way to estimate the spring constant for less precise work.Keywords
This publication has 9 references indexed in Scilit:
- Measurement of forces in liquids using a force microscopeLangmuir, 1992
- Measuring adhesion, attraction, and repulsion between surfaces in liquids with an atomic-force microscopePhysical Review B, 1992
- Vibrationally resolved photoelectron-spin-polarization spectroscopy of HI moleculesPhysical Review A, 1992
- Direct measurement of colloidal forces using an atomic force microscopeNature, 1991
- Microfabrication of cantilever styli for the atomic force microscopeJournal of Vacuum Science & Technology A, 1990
- Novel optical approach to atomic force microscopyApplied Physics Letters, 1988
- Atomic Resolution with Atomic Force MicroscopeEurophysics Letters, 1987
- Atomic Force MicroscopePhysical Review Letters, 1986
- Measurement of forces between two mica surfaces in aqueous electrolyte solutions in the range 0–100 nmJournal of the Chemical Society, Faraday Transactions 1: Physical Chemistry in Condensed Phases, 1978