Screening method for laser diodes with high reliability
- 10 May 1984
- journal article
- Published by Institution of Engineering and Technology (IET) in Electronics Letters
- Vol. 20 (10) , 397-398
- https://doi.org/10.1049/el:19840275
Abstract
Selection after aging for a few thousand hours at 70°C, following an initial hard screening, is proposed as a practical way to pick up reliable devices for undersea transmission systems.Keywords
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