Experiences in the Application of Item Response Theory in Test Construction
- 1 October 1989
- journal article
- Published by Taylor & Francis in Applied Measurement in Education
- Vol. 2 (4) , 297-312
- https://doi.org/10.1207/s15324818ame0204_3
Abstract
Certain potential benefits of using item response theory in test construction are discussed and evaluated using the experience and evidence accumulated during 9 years of using a three-parameter model in the construction of major achievement batteries. We also discuss several cautions and limitations in realizing these benefits as well as issues in need of further research. The potential benefits considered are those of getting "sample-free" item calibrations and "item-free" person measurement, automatically equating various tests, decreasing the standard errors of scores without increasing the number of items used by using item pattern scoring, assessing item bias (or differential item functioning) independently of difficulty in a manner consistent with item selection, being able to determine just how adequate a tryout pool of items may be, setting up computer-generated "ideal" tests drawn from pools as targets for test developers, and controlling the standard error of a selected test at any desired set of score levels.Keywords
This publication has 8 references indexed in Scilit:
- The Future of Item AnalysisJournal of Educational Measurement, 1989
- Implications of Item Response Theory for the Measurement PractitionerApplied Measurement in Education, 1988
- Valid Normative Information From Customized Achievement TestsEducational Measurement: Issues and Practice, 1987
- OBTAINING MAXIMUM LIKELIHOOD TRAIT ESTIMATES FROM NUMBER‐CORRECT SCORES FOR THE THREE‐PARAMETER LOGISTIC MODELJournal of Educational Measurement, 1984
- Tau-Equivalence and Equipercentile EquatingPsychometrika, 1983
- INTERACTIONS BETWEEN ITEM CONTENT AND GROUP MEMBERSHIP ON ACHIEVEMENT TEST ITEMSJournal of Educational Measurement, 1981
- THE EXTENT, CAUSES AND IMPORTANCE OF CONTEXT EFFECTS ON ITEM PARAMETERS FOR TWO LATENT TRAIT MODELSJournal of Educational Measurement, 1980
- A method of scaling psychological and educational tests.Journal of Educational Psychology, 1925