Characterization of Thick Films Formed on Slip Rings During High Current Density Operation
- 1 March 1981
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Components, Hybrids, and Manufacturing Technology
- Vol. 4 (1) , 30-35
- https://doi.org/10.1109/tchmt.1981.1135785
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- High-Current Brushes Part VI: Evaluation of Slip Ring Surface FilmsIEEE Transactions on Components, Hybrids, and Manufacturing Technology, 1980
- High-Current Brushes, Part III: Performance Evaluation for Sintered Silver-Graphite GradesIEEE Transactions on Components, Hybrids, and Manufacturing Technology, 1979
- Dependence of the Conduction Mechanism on Polarity in Stationary and Sliding Contacts When High-Resistivity Film Is Present in the ContactIEEE Transactions on Power Apparatus and Systems, 1965
- X-Ray Diffraction in Random Layer LatticesPhysical Review B, 1941