On the current density dependence of electromigration in thin films

1 May 1970

journal article
Published by Institute of Electrical and Electronics Engineers (IEEE) in Proceedings of the IEEE

Vol. 58 (5) , 833
https://doi.org/10.1109/PROC.1970.7772

Abstract

Comments are made on a recently publicized theory on electromigration in thin films. It is shown that the rate of electromigration is a linear function of the current density and not a quadratic function as proposed by Black.

Keywords

CURRENT DENSITY
ELECTROMIGRATION
TRANSISTORS
ELECTRONS
OSCILLATORS
ALUMINUM
CRYSTALLIZATION
HISTORY
SOLIDS
SPECTRAL ANALYSIS

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