Quasi-TEM spectral domain analysis of thick microstrip for microwave and digital integrated circuits

31 August 1989

journal article
Published by Institution of Engineering and Technology (IET) in Electronics Letters

Vol. 25 (18) , 1253-1254
https://doi.org/10.1049/el:19890840

Abstract

A procedure to compute the effective dielectric constants and characteristic impedances of thick microstrip is formulated utilising the computationally efficient quasi-TEM spectral domain method. The results calculated for the impedance and effective dielectric constant are shown to agree well with those obtained by the integral equation and finite element methods. The decrease in the effective dielectric constant of a microstrip as a function of strip thickness is also shown to agree well with the measured data.

Keywords

FINITE ELEMENT METHODS
THICK MICROSTRIP
INTEGRAL EQUATION
STRIP THICKNESS
CHARACTERISTIC IMPEDANCES
EFFECTIVE DIELECTRIC CONSTANTS
MICROWAVE IC
COMPUTATIONALLY EFFICIENT QUASI-TEM SPECTRAL DOMAIN METHOD
DIGITAL INTEGRATED CIRCUITS

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