Evaluation of truncation methods for accurate centroid lattice parameter determination

• 1 October 1964
• journal article
• Published by International Union of Crystallography (IUCr) in Acta Crystallographica
• Vol. 17  (10) , 1229-1245
• https://doi.org/10.1107/s0365110x64003164

Abstract

Keywords

• TUNGSTEN
• SILICON
• X RAY SPECTROSCOPY
• CRYSTALLOGRAPHY
• X RAY DIFFRACTION
• LATTICE PARAMETER
• TEST METHODS
• CRYSTAL LATTICES
• POWDERS